Chair of Opto-Electronic Components and Systems
Organisational unit: Chair
Organisation profile
Former Chair Holder: Prof. Dr.-Ing. Hubert Lakner
Contact
- TUD website: https://tu-dresden.de/ing/elektrotechnik/ihm/oes
Related content and researchers (public profile)
- Research output
- Journals
Quasi-statischer MOEMS-Gitterscanner zum spektralen Durchstimmen eines MIR-Quantenkaskadenlasers
Merten, A., Schroedter, R., Dreyhaupt, A., Graßhoff, T., Schwarzenberg, M., Hugger, S. & Schilling, C. & 2 others, Grahmann, J. & Ostendorf, R., Mar 2019, In: Technisches Messen : tm ; Sensoren, Geräte, Systeme. 86, 3, p. 131-143Research output: Contribution to journal › Research article › Contributed › peer-review
Switching Kinetics in Nanoscale Hafnium Oxide Based Ferroelectric Field-Effect Transistors
Mulaosmanovic, H., Ocker, J., Müller, S., Schroeder, U., Müller, J., Polakowski, P. & Flachowsky, S. & 3 others, Bentum, R. V., Mikolajick, T. & Slesazeck, S., 1 Feb 2017, In: ACS applied materials & interfaces. 9, 4, p. 3792–3798 7 p.Research output: Contribution to journal › Research article › Contributed › peer-review
A 28nm HKMG super low power embedded NVM technology based on ferroelectric FETs
Trentzsch, M., Flachowsky, S., Richter, R., Paul, J., Reimer, B., Utess, D. & Jansen, S. & 11 others, Mulaosmanovic, H., Muller, S., Slesazeck, S., Ocker, J., Noack, M., Muller, J., Polakowski, P., Schreiter, J., Beyer, S., Mikolajick, T. & Rice, B., 31 Jan 2017, 2016 IEEE International Electron Devices Meeting, IEDM 2016. Institute of Electrical and Electronics Engineers Inc., p. 11.5.1-11.5.4 7838397. (Technical Digest - International Electron Devices Meeting, IEDM).Research output: Contribution to book/Conference proceedings/Anthology/Report › Conference contribution › Contributed › peer-review
Novel ferroelectric FET based synapse for neuromorphic systems
Mulaosmanovic, H., Ocker, J., Muller, S., Noack, M., Muller, J., Polakowski, P. & Mikolajick, T. & 1 others, Slesazeck, S., 2017, Digest of Technical Papers - Symposium on VLSI Technology.Research output: Contribution to book/Conference proceedings/Anthology/Report › Conference contribution › Contributed › peer-review
Correlation between the macroscopic ferroelectric material properties of Si:HfO<inf>2</inf>and the statistics of 28 nm FeFET memory arrays
Mueller, S., Slesazeck, S., Henker, S., Flachowsky, S., Polakowski, P., Paul, J. & Smith, E. & 2 others, Müller, J. & Mikolajick, T., 2016, In: Ferroelectrics. 497, 1, p. 42-51 10 p.Research output: Contribution to journal › Research article › Contributed › peer-review
ECS Journal of Solid State Science and Technology : JSS
ISSNs: 2162-8769
Additional searchable ISSN (electronic): 2162-8777
Electrochemical Society Inc., United States of America
Scopus rating (2023): CiteScore 4.5 SJR 0.416 SNIP 0.605
Journal
Proceedings of SPIE: 9798
ISSNs: 0277-786X, 0361-0748, 0038-7355
SPIE - The international society for optics and photonics, Bellingham
Scopus rating (2023): CiteScore 0.5 SJR 0.152 SNIP 0.202
Journal: Book series
Japanese Journal of Applied Physics, Part 2: Letters
ISSNs: 0021-4922, 1347-4065
Japan Society of Applied Physics
Journal
Microelectronic Engineering
ISSNs: 0167-9317
Elsevier Science B.V., Netherlands
Scopus rating (2023): CiteScore 5.3 SJR 0.503 SNIP 0.847
Journal
Technisches Messen : tm ; Sensoren, Geräte, Systeme
ISSNs: 0171-8096, 0340-837X
Additional searchable ISSN (electronic): 2196-7113
De Gruyter, Berlin [u. a.], Germany
Scopus rating (2023): CiteScore 1.7 SJR 0.241 SNIP 0.506
Journal