Chair of Opto-Electronic Components and Systems
Organisational unit: Chair
Organisation profile
Former Chair Holder: Prof. Dr.-Ing. Hubert Lakner
Contact
- TUD website: https://tu-dresden.de/ing/elektrotechnik/ihm/oes
Related content and researchers (public profile)
- Research output
- Journals
Quasi-statischer MOEMS-Gitterscanner zum spektralen Durchstimmen eines MIR-Quantenkaskadenlasers
Merten, A., Schroedter, R., Dreyhaupt, A., Graßhoff, T., Schwarzenberg, M., Hugger, S., Schilling, C., & 2 othersGrahmann, J. & Ostendorf, R., Mar 2019, In: Technisches Messen : tm ; Sensoren, Geräte, Systeme. 86, 3, p. 131-143Research output: Contribution to journal › Research article › Contributed › peer-review
Switching Kinetics in Nanoscale Hafnium Oxide Based Ferroelectric Field-Effect Transistors
Mulaosmanovic, H., Ocker, J., Müller, S., Schroeder, U., Müller, J., Polakowski, P., Flachowsky, S., & 3 othersBentum, R. V., Mikolajick, T. & Slesazeck, S., 1 Feb 2017, In: ACS applied materials & interfaces. 9, 4, p. 3792–3798 7 p.Research output: Contribution to journal › Research article › Contributed › peer-review
A 28nm HKMG super low power embedded NVM technology based on ferroelectric FETs
Trentzsch, M., Flachowsky, S., Richter, R., Paul, J., Reimer, B., Utess, D., Jansen, S., & 11 othersMulaosmanovic, H., Muller, S., Slesazeck, S., Ocker, J., Noack, M., Muller, J., Polakowski, P., Schreiter, J., Beyer, S., Mikolajick, T. & Rice, B., 31 Jan 2017, 2016 IEEE International Electron Devices Meeting, IEDM 2016. Institute of Electrical and Electronics Engineers Inc., p. 11.5.1-11.5.4 7838397. (Technical Digest - International Electron Devices Meeting, IEDM).Research output: Contribution to book/Conference proceedings/Anthology/Report › Conference contribution › Contributed › peer-review
Novel ferroelectric FET based synapse for neuromorphic systems
Mulaosmanovic, H., Ocker, J., Muller, S., Noack, M., Muller, J., Polakowski, P., Mikolajick, T., & 1 othersSlesazeck, S., 2017, Digest of Technical Papers - Symposium on VLSI Technology.Research output: Contribution to book/Conference proceedings/Anthology/Report › Conference contribution › Contributed › peer-review
Correlation between the macroscopic ferroelectric material properties of Si:HfO<inf>2</inf>and the statistics of 28 nm FeFET memory arrays
Mueller, S., Slesazeck, S., Henker, S., Flachowsky, S., Polakowski, P., Paul, J., Smith, E., & 2 othersMüller, J. & Mikolajick, T., 2016, In: Ferroelectrics. 497, 1, p. 42-51 10 p.Research output: Contribution to journal › Research article › Contributed › peer-review
ECS Journal of Solid State Science and Technology : JSS
ISSNs: 2162-8769
Additional searchable ISSN (electronic): 2162-8777
Electrochemical Society, Inc., United States of America
Scopus rating (2023): CiteScore 4.5 SJR 0.416 SNIP 0.605
Journal
IFAC-PapersOnLine
ISSNs: 1474-6670, 2405-8963
Additional searchable ISSN (electronic): 2405-8963
Elsevier, Berlin [u.a.], Austria
Scopus rating (2022): CiteScore 1.8 SJR 0.354 SNIP 0.519
Journal
Proceedings of SPIE
ISSNs: 0277-786X, 0361-0748, 0038-7355
SPIE - The international society for optics and photonics, Bellingham
Scopus rating (2023): CiteScore 0.5 SJR 0.152 SNIP 0.202
Journal: Book series
Japanese Journal of Applied Physics, Part 2: Letters
ISSNs: 0021-4922, 1347-4065
Japan Society of Applied Physics
Scopus rating (2023): CiteScore 3 SJR 0.307 SNIP 0.631
Journal
Microelectronic Engineering
ISSNs: 0167-9317
Elsevier Science B.V., Netherlands
Scopus rating (2023): CiteScore 5.3 SJR 0.503 SNIP 0.847
Journal