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Prof. Dr.-Ing. Thomas Mikolajick

Person

Research interests

  • Semiconductor Memories
  • Ferroelectrics
  • Reconfigurable devices
  • Memristive Devices
  • GaN
  • Solar cells
  • Devices based on 2D materials

Career

  • 1990 - 1995 Scientific co-worker at the chair of electron devices  Friedrich-Alexander Universität Erlangen-Nürnberg
  • 1995 - 1996 Group leader at Fraunhofer IIS-B Erlangen
  • 1996 - 1999 Process engineer at Siemens Semiconductor Regensburg 
  • 1999 - 2000 Teamleader Integration of ferroelectric memories at Infineon Munich
  • 2000 - 2002 Teamleader new memory technologies at Infineon Munich
  • 2002 -2006 Manager Flash predevelopment at Infinen/Qimonda Dresden
  • 2006 - 2009 Professor for material science of electron devices and sensors at TU Bergakademie Freiberg

External positions

Visiting Professor, Pusan National University

1 Sept 2020 → 31 Aug 2022

Director, NaMLab - Nanoelectronic materials laboratory gGmbH

1 Oct 2009 → …

Identification Numbers

ORCID Orcid 0000-0003-3814-0378, external link
Scopus author ID 6604007269
Researcher ID F-8427-2011

Related content

Improved 2D charge carrier quantification workflow for scanning spreading resistance microscopy

Adlmaier, T., Doering, S., Binder, B., Simon, D. K., Mikolajick, T. & Eng, L. M., May 2025, In: Microelectronics Reliability. 168, 115646.

Research output: Contribution to journal › Research article › Contributed › peer-review

Edge of Chaos Theory Unveils the First and Simplest Ever Reported Hodgkin–Huxley Neuristor

Ascoli, A., Demirkol, A. S., Messaris, I., Ntinas, V., Prousalis, D., Slesazeck, S. & Mikolajick, T. & 6 others, Corinto, F., Bonnin, M., Gilli, M., Civalleri, P. P., Tetzlaff, R. & Chua, L., 6 Mar 2025, (E-pub ahead of print) In: Advanced electronic materials.

Research output: Contribution to journal › Research article › Contributed › peer-review

Interaction Between Strain and Phase Formation in HfxZr1-xO2 Thin Films

Wunderwald, F., Xu, B., Kersch, A., Holsgrove, K. M., Kao, Y. C., Richter, C. & Enghardt, S. & 2 others, Mikolajick, T. & Schroeder, U., 5 Mar 2025, In: Small. 2408133.

Research output: Contribution to journal › Research article › Contributed › peer-review

Interaction Between Strain and Phase Formation in HfxZr1-xO2 Thin Films

Wunderwald, F., Xu, B., Kersch, A., Holsgrove, K. M., Kao, Y. C., Richter, C. & Enghardt, S. & 2 others, Mikolajick, T. & Schroeder, U., 5 Mar 2025, In: Small. 21, 9, 2408133.

Research output: Contribution to journal › Research article › Contributed › peer-review

Long-Term Stability and Oxidation of Ferroelectric AlScN Devices: An Operando Hard X-ray Photoelectron Spectroscopy Study

Rehm, O., Baumgarten, L., Guido, R., Düring, P. M., Gloskovskii, A., Schlueter, C. & Mikolajick, T. & 2 others, Schroeder, U. & Müller, M., Mar 2025, In: Physica Status Solidi - Rapid Research Letters. 19, 3, 2400307.

Research output: Contribution to journal › Research article › Contributed › peer-review

View all research output (670)