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Improved 2D charge carrier quantification workflow for scanning spreading resistance microscopy

Adlmaier, T., Doering, S., Binder, B., Simon, D. K., Mikolajick, T. & Eng, L. M., May 2025, In: Microelectronics Reliability. 168, 115646.

Research output: Contribution to journal › Research article › Contributed › peer-review

The role of surface deformation on responsivity of the pillared layer metal–organic framework DUT-8(Ni)

Abylgazina, L., Senkovska, I., Maliuta, M., Bachetzky, C., Rauche, M., Pöschel, K. & Schmidt, J. & 14 others, Isaacs, M., Morgan, D., Otyepka, M., Otyepkova, E., Mendt, M., More, Y. D., Buschbeck, R., Schneemann, A., Synytska, A., Pöppl, A., Eng, L. M., Tan, J.-C., Brunner, E. & Kaskel, S., 6 Mar 2025, (E-pub ahead of print) In: Chemical Science. 16 p.

Research output: Contribution to journal › Research article › Contributed › peer-review

Ultraconfined THz Phonon Polaritons in Hafnium Dichalcogenides

Kowalski, R. A., Mueller, N. S., Álvarez-Pérez, G., Obst, M., Diaz-Granados, K., Carini, G. & Senarath, A. & 14 others, Dixit, S., Niemann, R., Iyer, R. B., Kaps, F. G., Wetzel, J., Klopf, J. M., Kravchenko, I. I., Wolf, M., Folland, T. G., Eng, L. M., Kehr, S. C., Alonso-Gonzalez, P., Paarmann, A. & Caldwell, J. D., 14 Feb 2025, 19 p.

Research output: Preprint/Documentation/Report › Preprint

Second-order nonlinear piezo-optic properties of single crystal lithium niobate thin films

Pionteck, M. N., Roeper, M., Koppitz, B., Seddon, S. D., Rüsing, M., Padberg, L. & Eigner, C. & 3 others, Silberhorn, C., Sanna, S. & Eng, L. M., 1 Feb 2025, In: Physical Review B. 111, 6, 13 p., 064109.

Research output: Contribution to journal › Research article › Contributed › peer-review

Two-dimensional talc as a natural hyperbolic material

Feres, F. H., Maia, F. C. B., Chen, S., Mayer, R. A., Obst, M., Hatem, O. & Wehmeier, L. & 10 others, Nörenberg, T., Queiroz, M. S., Mazzotti, V., Klopf, J. M., Kehr, S. C., Eng, L. M., Cadore, A. R., Hillenbrand, R., Freitas, R. O. & Barcelos, I. D., 28 Jan 2025.

Research output: Preprint/Documentation/Report › Preprint

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