Skip to content Skip to footer

IEEE Transactions on Device and Materials Reliability

ISSNs: 1530-4388

IEEE, New York [u. a.]

Scopus rating (2023): CiteScore 4.8 SJR 0.436 SNIP 1.148

Journal

Titles
  • IEEE Transactions on Device and Materials Reliability
  • IEEE transactions on device and materials reliability
ISSNs1530-4388
PublisherIEEE, New York [u. a.]
ZDB-ID2057871-4
ZDB-ID2061445-7

Related content