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IEEE Transactions on Device and Materials Reliability

ISSNs: 1530-4388

IEEE, New York [u. a.]

Scopus rating (2023): CiteScore 4.8 SJR 0.436 SNIP 1.148

Journal

Titles	IEEE Transactions on Device and Materials Reliability IEEE transactions on device and materials reliability
ISSNs	1530-4388
Publisher	IEEE, New York [u. a.]
ZDB-ID	2057871-4
ZDB-ID	2061445-7

Chohan, T., Zhao, Z., Lehmann, S., Arfaoui, W., Bossu, G., Trommer, J., Slesazeck, S., & 2 othersMikolajick, T. & Siddabathula, M., 16 Jun 2022, In: IEEE transactions on device and materials reliability. 22, 3, p. 387-395 9 p.

Research output: Contribution to journal › Research article › Contributed › peer-review

Oberst, M., Schlegel, S., Großmann, S., Willing, H. & Freudenberger, R., 2020, In: IEEE Transactions on Device and Materials Reliability. 20, 1, p. 157-166

Research output: Contribution to journal › Research article › Contributed

Pesic, M., Schroeder, U., Slesazeck, S. & Mikolajick, T., Jun 2018, In: IEEE transactions on device and materials reliability. 18, 2, p. 154-162 9 p.

Research output: Contribution to journal › Research article › Contributed › peer-review

Knebel, S., Zhou, D., Schroeder, U., Slesazeck, S., Pešíc, M., Agaiby, R., Heitmann, J., & 1 othersMikolajick, T., 2017, In: IEEE transactions on device and materials reliability. 17, 2, p. 324 - 330

Research output: Contribution to journal › Research article › Contributed › peer-review

Moayedi, E., Rosenkranz, R., Clausner, A., Pakbaz, K., Zschech, E. & Garitagoitia Cid, M. A., 1 Dec 2016, In: IEEE transactions on device and materials reliability. 16, 4, p. 461-464 4 p.

Research output: Contribution to journal › Research article › Contributed › peer-review