Cu-In-Microbumps for Low-Temperature Bonding of Fine-Pitch-Interconnects
Research output: Contribution to conferences › Paper › Contributed › peer-review
Contributors
Details
| Original language | English |
|---|---|
| Publication status | Published - 2017 |
| Peer-reviewed | Yes |
Conference
| Title | 2017 IEEE 67th Electronic Components and Technology Conference |
|---|---|
| Abbreviated title | ECTC 2017 |
| Conference number | 67 |
| Duration | 30 May - 2 June 2017 |
| City | Lake Buena Vista |
| Country | United States of America |
External IDs
| Scopus | 85028040468 |
|---|---|
| ORCID | /0000-0001-8576-7611/work/165877185 |