Cu-In-Microbumps for Low-Temperature Bonding of Fine-Pitch-Interconnects

Research output: Contribution to conferencesPaperContributedpeer-review

Contributors

Details

Original languageEnglish
Publication statusPublished - 2017
Peer-reviewedYes

Conference

Title2017 IEEE 67th Electronic Components and Technology Conference
Abbreviated titleECTC 2017
Conference number67
Duration30 May - 2 June 2017
CityLake Buena Vista
CountryUnited States of America

External IDs

Scopus 85028040468
ORCID /0000-0001-8576-7611/work/165877185