Analysis of threshold voltage instability in AlGaN/GaN MISHEMTs by forward gate voltage stress pulses
Research output: Contribution to journal › Research article › Contributed › peer-review
Contributors
Details
Original language | English |
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Pages (from-to) | 1246-1251 |
Number of pages | 6 |
Journal | Physica Status Solidi (A) Applications and Materials Science |
Volume | 213 |
Issue number | 5 |
Publication status | Published - 18 Jan 2016 |
Peer-reviewed | Yes |
External IDs
Scopus | 84968866570 |
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