Advancing Electronic Package Reliability Analysis by Predicting Solder Joint Strain Patterns Using Neural Networks

Publikation: Beitrag in Buch/Konferenzbericht/Sammelband/GutachtenBeitrag in KonferenzbandBeigetragenBegutachtung

Abstract

The demand for faster development of reliable electronic packages drives the development of virtual qualification approaches. This work introduces the development of neural networks based on data synthesized from finite element calculations. It was the aim to enable predictions of characteristic solder joint strain values and patterns for life time assessment and damage mode identification. For the load scenario of sinusoidal vibration at different temperatures two neural networks were generated. First, with the target to predict equivalent plastic strain values, a RNN model was developed including evaluating the application of dropout layers. The best performing model had 2 hidden layers with 20 neurons per layer and showed very good test performance (MSE =2.29 e-9). Second, a FNN was generated to enable plastic strain pattern predictions. A model with a 3 layer structure and 64 and 128 neurons per layer respectively was found to have good performance (MSE=3.78 e-06) and passed a comparison against finite element calculated strain patterns and damage observations from actual vibration experiments.

Details

OriginalspracheEnglisch
TitelProceedings of the 27th Electronics Packaging Technology Conference, EPTC 2025
Redakteure/-innenSunmi Shin, Chin Hock Toh, Yeow Kheng Lim, Xueren Zhang, Vivek Chidambaram, King Jien Chui
Herausgeber (Verlag)Institute of Electrical and Electronics Engineers (IEEE)
ISBN (elektronisch)9798331561451
PublikationsstatusVeröffentlicht - 2025
Peer-Review-StatusJa

Publikationsreihe

ReiheProceedings of the 27th Electronics Packaging Technology Conference, EPTC 2025

Konferenz

Titel27th Electronics Packaging Technology Conference, EPTC 2025
Dauer2 - 5 Dezember 2025
StadtSingapore
LandSingapur