Thickness dependent barrier performance of permeation barriers made from atomic layer deposited alumina for organic devices

Research output: Contribution to journal › Research article › Contributed › peer-review

Contributors

Details

Original languageEnglish
Pages (from-to)138-143
JournalOrganic electronics
Volume17
Publication statusPublished - Feb 2015
Peer-reviewedYes

External IDs

Scopus 84919598730
ORCID /0000-0003-3814-0378/work/142256107

Keywords

Keywords

  • ALD, Defect density, Thickness dependency, Electrodeposition, WVTR, OLED

Library keywords