The Effect of Downscaling the Dimensions of Solder Interconnects on their Creep Properties

Research output: Contribution to book/conference proceedings/anthology/reportConference contributionContributed

Contributors

Abstract

The creep behaviour of solders is an important input for accurate material models for FE-analysis of electronic assemblies. Usually the mechanical behaviour of solders, is been determined by tensile tests on bulk solder specimens. Although performing these tests is not complicated and the results are easy to interpret, one of the key problems lies in the fact that solder joints are very small and therefore cannot be represented by large tensile specimens. The paper describes the attempts to gain deformation data on ultra small solder joints. It compares creep data that was experimentally gained on bulky samples and on small solder joints.

Details

Original languageGerman
Title of host publication2007 International Conference on Thermal, Mechanical and Multi-Physics Simulation Experiments in Microelectronics and Micro-Systems. EuroSime 2007
PublisherIEEE
Pages1-8
Number of pages8
ISBN (print)1-4244-1106-8
Publication statusPublished - 18 Apr 2007
Peer-reviewedNo

Conference

Title2007 International Conference on Thermal, Mechanical and Multi-Physics Simulation Experiments in Microelectronics and Micro-Systems. EuroSime 2007
Duration16 - 18 April 2007
LocationLondon, UK

External IDs

Scopus 36348959132

Keywords

Keywords

  • Creep, Soldering, Electronics packaging, Assembly, Materials testing, Force measurement, Electronic packaging thermal management, Manufacturing processes, Reliability theory, Failure analysis