The Effect of Downscaling the Dimensions of Solder Interconnects on their Creep Properties

Publikation: Beitrag in Buch/Konferenzbericht/Sammelband/GutachtenBeitrag in KonferenzbandBeigetragen

Beitragende

Abstract

The creep behaviour of solders is an important input for accurate material models for FE-analysis of electronic assemblies. Usually the mechanical behaviour of solders, is been determined by tensile tests on bulk solder specimens. Although performing these tests is not complicated and the results are easy to interpret, one of the key problems lies in the fact that solder joints are very small and therefore cannot be represented by large tensile specimens. The paper describes the attempts to gain deformation data on ultra small solder joints. It compares creep data that was experimentally gained on bulky samples and on small solder joints.

Details

OriginalspracheDeutsch
Titel2007 International Conference on Thermal, Mechanical and Multi-Physics Simulation Experiments in Microelectronics and Micro-Systems. EuroSime 2007
Herausgeber (Verlag)IEEE
Seiten1-8
Seitenumfang8
ISBN (Print)1-4244-1106-8
PublikationsstatusVeröffentlicht - 18 Apr. 2007
Peer-Review-StatusNein

Konferenz

Titel2007 International Conference on Thermal, Mechanical and Multi-Physics Simulation Experiments in Microelectronics and Micro-Systems. EuroSime 2007
Dauer16 - 18 April 2007
OrtLondon, UK

Externe IDs

Scopus 36348959132

Schlagworte

Schlagwörter

  • Creep, Soldering, Electronics packaging, Assembly, Materials testing, Force measurement, Electronic packaging thermal management, Manufacturing processes, Reliability theory, Failure analysis