Review and perspective on ferroelectric HfO <inf>2</inf> -based thin films for memory applications
Research output: Contribution to journal › Research article › Contributed › peer-review
Contributors
Details
Original language | English |
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Pages (from-to) | 795–808 |
Number of pages | 14 |
Journal | MRS communications |
Volume | 8 |
Publication status | Published - 2018 |
Peer-reviewed | Yes |
External IDs
Scopus | 85052932053 |
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