Reliability Analysis of Surface Mount Interconnect Technologies Suitable for Temperatures Up to 200°C
Research output: Contribution to book/Conference proceedings/Anthology/Report › Conference contribution › Contributed
Contributors
Abstract
In recent years there has been an increased need for high-temperature-resistant electronics both in power electronics and in robust sensor systems for industrial applications. This is often linked to the development of new materials and technologies. However, there are a number of applications where the use of SMT or THT-compatible components and interconnect technologies is an alternative for both cost reasons and the load scenario. This paper presents reliability studies for the manufacturing of high-temperature-resistant electronics in SMT assembly based on commercial components for the isothermal load case of 200°C. The evaluation criteria include both the electrical properties and the consideration of the shear strengths with the associated fracture patterns.
Details
| Original language | English |
|---|---|
| Title of host publication | 2024 IEEE 10th Electronics System-Integration Technology Conference (ESTC) |
| Publisher | IEEE Canada |
| Number of pages | 8 |
| ISBN (electronic) | 979-8-3503-9036-0 |
| ISBN (print) | 979-8-3503-9037-7 |
| Publication status | Published - 13 Sept 2024 |
| Peer-reviewed | No |
Publication series
| Series | Electronics System-Integration Technology Conference, ESTC |
|---|---|
| ISSN | 2687-9700 |
Conference
| Title | 10th Electronics System-Integration Technology Conference |
|---|---|
| Abbreviated title | ESTC 2024 |
| Conference number | 10 |
| Duration | 11 - 13 September 2024 |
| Website | |
| Location | MOA Berlin |
| City | Berlin |
| Country | Germany |
External IDs
| Scopus | 85208091166 |
|---|---|
| ORCID | /0000-0001-8576-7611/work/196678952 |
Keywords
ASJC Scopus subject areas
Keywords
- Assembly, Isothermal processes, Lead, Power electronics, Process control, Reliability engineering, Sensor systems, Standards, Surface mount technology, Temperature, interconnect technologies, reliability, high-temperature electronics