Reliability Analysis of Surface Mount Interconnect Technologies Suitable for Temperatures Up to 200°C
Publikation: Beitrag in Buch/Konferenzbericht/Sammelband/Gutachten › Beitrag in Konferenzband › Beigetragen
Beitragende
Abstract
In recent years there has been an increased need for high-temperature-resistant electronics both in power electronics and in robust sensor systems for industrial applications. This is often linked to the development of new materials and technologies. However, there are a number of applications where the use of SMT or THT-compatible components and interconnect technologies is an alternative for both cost reasons and the load scenario. This paper presents reliability studies for the manufacturing of high-temperature-resistant electronics in SMT assembly based on commercial components for the isothermal load case of 200°C. The evaluation criteria include both the electrical properties and the consideration of the shear strengths with the associated fracture patterns.
Details
| Originalsprache | Englisch |
|---|---|
| Titel | 2024 IEEE 10th Electronics System-Integration Technology Conference (ESTC) |
| Herausgeber (Verlag) | IEEE Canada |
| Seitenumfang | 8 |
| ISBN (elektronisch) | 979-8-3503-9036-0 |
| ISBN (Print) | 979-8-3503-9037-7 |
| Publikationsstatus | Veröffentlicht - 13 Sept. 2024 |
| Peer-Review-Status | Nein |
Publikationsreihe
| Reihe | Electronics System-Integration Technology Conference, ESTC |
|---|---|
| ISSN | 2687-9700 |
Konferenz
| Titel | 10th Electronics System-Integration Technology Conference |
|---|---|
| Kurztitel | ESTC 2024 |
| Veranstaltungsnummer | 10 |
| Dauer | 11 - 13 September 2024 |
| Webseite | |
| Ort | MOA Berlin |
| Stadt | Berlin |
| Land | Deutschland |
Externe IDs
| Scopus | 85208091166 |
|---|---|
| ORCID | /0000-0001-8576-7611/work/196678952 |
Schlagworte
ASJC Scopus Sachgebiete
Schlagwörter
- Assembly, Isothermal processes, Lead, Power electronics, Process control, Reliability engineering, Sensor systems, Standards, Surface mount technology, Temperature, interconnect technologies, reliability, high-temperature electronics