Nanoscale non-destructive electric field probing in ferroelectrics, organic molecular films, and near-field optical nanodevices

Research output: Contribution to journalConference articleContributedpeer-review

Contributors

  • Lukas M. Eng - , Chair of Experimental Physics / Photophysics (Author)
  • Stefan Grafström - , TUD Dresden University of Technology (Author)
  • Ingo Hellmann - , TUD Dresden University of Technology (Author)
  • Christian Loppacher - , TUD Dresden University of Technology (Author)
  • Tobias Otto - , Chair of Physical Chemistry (Author)
  • Jan Renger - , TUD Dresden University of Technology (Author)
  • Frank Schlaphof - , TUD Dresden University of Technology (Author)
  • Jan Seidel - , TUD Dresden University of Technology (Author)
  • Ulrich Zerweck - , TUD Dresden University of Technology (Author)

Abstract

Inspecting and tuning electric fields on the nanometer scale offers a great potential in overcoming limitations inherent in assembling nanostructures. Both optical and electronic devices may be improved in performance provided that a quantitative knowledge on the strength and orientation of local (stray) fields is gained. Here we present nanoscale investigations of functional surfaces probing the surface potential and electronic properties of ferroelectric and ultra thin organic films. We developed methodologies that are able to non-invasively track the electric field both above and below interfaces, thus providing insight also into the sample. Hence, interface dipole formation and interface charging directly shows up in potential changes revealing the donor/acceptor characteristics of molecules, as well as the surface charge screening in ferroelectrics. Such inspections are possible using conventional scanning force microscopy operated in sophisticated modes measuring the electrostatic force or the inverse piezoelectric effect. Finally, electric fields are also probed in the optical regime using near-field optical methods. Examples are shown where the strength and frequency of surface plasmon resonances become tunable due to simple nanostructuring of metallic thin films.

Details

Original languageEnglish
Pages (from-to)21-35
Number of pages15
Journal Proceedings of SPIE - The International Society for Optical Engineering
Volume5392
Publication statusPublished - 2004
Peer-reviewedYes

Conference

TitleTesting, Reliability, and Application of Micro and Nano-Material Systems II
Duration15 - 17 March 2004
CitySan Diego, CA
CountryUnited States of America

External IDs

ORCID /0000-0002-2484-4158/work/176339473

Keywords

Keywords

  • Electric field enhancement, Ferroelectrics, Kelvin prove force microscopy, Near-field optics, Organic molecules, Piezoresponse force microscopy, Scanning Probe Microscopy, Structured metallic thin films