Nanoscale non-destructive electric field probing in ferroelectrics, organic molecular films, and near-field optical nanodevices

Publikation: Beitrag in FachzeitschriftKonferenzartikelBeigetragenBegutachtung

Beitragende

  • Lukas M. Eng - , Professur für Experimentalphysik/Photophysik (Autor:in)
  • Stefan Grafström - , Technische Universität Dresden (Autor:in)
  • Ingo Hellmann - , Technische Universität Dresden (Autor:in)
  • Christian Loppacher - , Technische Universität Dresden (Autor:in)
  • Tobias Otto - , Professur für Physikalische Chemie (Autor:in)
  • Jan Renger - , Technische Universität Dresden (Autor:in)
  • Frank Schlaphof - , Technische Universität Dresden (Autor:in)
  • Jan Seidel - , Technische Universität Dresden (Autor:in)
  • Ulrich Zerweck - , Technische Universität Dresden (Autor:in)

Abstract

Inspecting and tuning electric fields on the nanometer scale offers a great potential in overcoming limitations inherent in assembling nanostructures. Both optical and electronic devices may be improved in performance provided that a quantitative knowledge on the strength and orientation of local (stray) fields is gained. Here we present nanoscale investigations of functional surfaces probing the surface potential and electronic properties of ferroelectric and ultra thin organic films. We developed methodologies that are able to non-invasively track the electric field both above and below interfaces, thus providing insight also into the sample. Hence, interface dipole formation and interface charging directly shows up in potential changes revealing the donor/acceptor characteristics of molecules, as well as the surface charge screening in ferroelectrics. Such inspections are possible using conventional scanning force microscopy operated in sophisticated modes measuring the electrostatic force or the inverse piezoelectric effect. Finally, electric fields are also probed in the optical regime using near-field optical methods. Examples are shown where the strength and frequency of surface plasmon resonances become tunable due to simple nanostructuring of metallic thin films.

Details

OriginalspracheEnglisch
Seiten (von - bis)21-35
Seitenumfang15
Fachzeitschrift Proceedings of SPIE - The International Society for Optical Engineering
Jahrgang5392
PublikationsstatusVeröffentlicht - 2004
Peer-Review-StatusJa

Konferenz

TitelTesting, Reliability, and Application of Micro and Nano-Material Systems II
Dauer15 - 17 März 2004
StadtSan Diego, CA
LandUSA/Vereinigte Staaten

Externe IDs

ORCID /0000-0002-2484-4158/work/176339473

Schlagworte

Schlagwörter

  • Electric field enhancement, Ferroelectrics, Kelvin prove force microscopy, Near-field optics, Organic molecules, Piezoresponse force microscopy, Scanning Probe Microscopy, Structured metallic thin films