Low-temperature transient liquid phase bonding via electroplated Sn/In-Sn metallization
Research output: Contribution to journal › Research article › Contributed › peer-review
Contributors
Abstract
Sn/In-Sn bonding interfaces obtained by the transient liquid phase (TLP) reaction were investigated for applications in low-temperature assembly. Bonding was achieved at temperatures below 150 °C with a low bonding pressure. Although a few voids were formed at the interfaces after bonding, the In-Sn metallization enabled low-temperature bonding due to the low eutectic temperature. A bonding mechanism to achieve this novel In-Sn low-temperature assembly was also proposed.
Details
Original language | English |
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Pages (from-to) | 2510-2515 |
Number of pages | 6 |
Journal | Journal of Materials Research and Technology |
Volume | 19 |
Publication status | Published - Jul 2022 |
Peer-reviewed | Yes |
External IDs
ORCID | /0000-0002-0757-3325/work/139064901 |
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ORCID | /0000-0001-8576-7611/work/165877177 |
Keywords
ASJC Scopus subject areas
Keywords
- Assembly technology, Electronic materials, In-Sn Intermetallics, Interfaces, Transient liquid phase reaction