Low-temperature transient liquid phase bonding via electroplated Sn/In-Sn metallization

Publikation: Beitrag in FachzeitschriftForschungsartikelBeigetragenBegutachtung

Beitragende

Abstract

Sn/In-Sn bonding interfaces obtained by the transient liquid phase (TLP) reaction were investigated for applications in low-temperature assembly. Bonding was achieved at temperatures below 150 °C with a low bonding pressure. Although a few voids were formed at the interfaces after bonding, the In-Sn metallization enabled low-temperature bonding due to the low eutectic temperature. A bonding mechanism to achieve this novel In-Sn low-temperature assembly was also proposed.

Details

OriginalspracheEnglisch
Seiten (von - bis)2510-2515
Seitenumfang6
FachzeitschriftJournal of Materials Research and Technology
Jahrgang19
PublikationsstatusVeröffentlicht - Juli 2022
Peer-Review-StatusJa

Externe IDs

ORCID /0000-0002-0757-3325/work/139064901
ORCID /0000-0001-8576-7611/work/165877177

Schlagworte

Schlagwörter

  • Assembly technology, Electronic materials, In-Sn Intermetallics, Interfaces, Transient liquid phase reaction

Bibliotheksschlagworte