Low-temperature transient liquid phase bonding via electroplated Sn/In-Sn metallization
Publikation: Beitrag in Fachzeitschrift › Forschungsartikel › Beigetragen › Begutachtung
Beitragende
Abstract
Sn/In-Sn bonding interfaces obtained by the transient liquid phase (TLP) reaction were investigated for applications in low-temperature assembly. Bonding was achieved at temperatures below 150 °C with a low bonding pressure. Although a few voids were formed at the interfaces after bonding, the In-Sn metallization enabled low-temperature bonding due to the low eutectic temperature. A bonding mechanism to achieve this novel In-Sn low-temperature assembly was also proposed.
Details
| Originalsprache | Englisch |
|---|---|
| Seiten (von - bis) | 2510-2515 |
| Seitenumfang | 6 |
| Fachzeitschrift | Journal of Materials Research and Technology |
| Jahrgang | 19 |
| Publikationsstatus | Veröffentlicht - Juli 2022 |
| Peer-Review-Status | Ja |
Externe IDs
| ORCID | /0000-0002-0757-3325/work/139064901 |
|---|---|
| ORCID | /0000-0001-8576-7611/work/165877177 |
Schlagworte
ASJC Scopus Sachgebiete
Schlagwörter
- Assembly technology, Electronic materials, In-Sn Intermetallics, Interfaces, Transient liquid phase reaction