High endurance strategies for hafnium oxide based ferroelectric field effect transistor

Research output: Contribution to book/conference proceedings/anthology/reportConference contributionInvitedpeer-review

Contributors

Details

Original languageEnglish
Title of host publication2016 16th Non-Volatile Memory Technology Symposium, NVMTS 2016
Publication statusPublished - 2016
Peer-reviewedYes

External IDs

Scopus 85010805086

Keywords