Flux-induced porous structures in Cu-SnAg solidliquid-interdiffusion microbump interconnects

Research output: Contribution to conferencesPaperContributedpeer-review

Contributors

Details

Original languageEnglish
Publication statusPublished - 2018
Peer-reviewedYes

Conference

Title7th Electronic System-Integration Technology Conference
Abbreviated titleESTC 2018
Conference number7
Duration18 - 21 September 2018
Website
LocationWestin Bellevue
CityDresden
CountryGermany

External IDs

Scopus 85060040515
ORCID /0000-0001-8576-7611/work/165877182