FeRAM technology for high density applications
Research output: Contribution to journal › Research article › Contributed › peer-review
Contributors
Details
Original language | English |
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Pages (from-to) | 947-950 |
Journal | Microelectronics Reliability |
Volume | 41 |
Issue number | 7 |
Publication status | Published - 2001 |
Peer-reviewed | Yes |
Externally published | Yes |
External IDs
Scopus | 0035394951 |
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