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Microelectronics Reliability

ISSNs: 0026-2714

Elsevier, Oxford [u.a.]

Scopus rating (2024): CiteScore 4.1 SJR 0.436 SNIP 0.932

Journal

Titles
  • Microelectronics Reliability
  • Microelectronics and reliability
Additional searchable titlesCan Reliab Symp, 5th, Proc, Microelectron Reliab, Microelectronics and Reliability, Semicond Technol, Sel Pap Presented at Annu SEMINEX Tech Semin and Exhib
ISSNs0026-2714
PublisherElsevier, Oxford [u.a.]
ZDB-ID240853-3

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