Microelectronics Reliability
ISSNs: 0026-2714
Elsevier, Oxford [u.a.]
Scopus rating (2022): CiteScore 2.8 SJR 0.364 SNIP 0.787
Journal
Titles |
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Additional searchable titles | Can Reliab Symp, 5th, Proc, Microelectron Reliab, Microelectronics and Reliability, Semicond Technol, Sel Pap Presented at Annu SEMINEX Tech Semin and Exhib |
ISSNs | 0026-2714 |
Publisher | Elsevier, Oxford [u.a.] |
ZDB-ID | 240853-3 |