Channel Length Dependence of Effective Barrier Height Experienced by Charge Carriers in Schottky-Barrier Transistors Based on Si-Nanowire Arrays

Research output: Contribution to journalResearch articleContributedpeer-review

Contributors

  • Dae Young Jeon - , Gyeongsang National University (Author)
  • So Jeong Park - , Korean Intellectual Property Office (Author)
  • Sebastian Pregl - , NaMLab - Nanoelectronic materials laboratory gGmbH (Author)
  • Jens Trommer - , NaMLab - Nanoelectronic materials laboratory gGmbH (Author)
  • Andre Heinzig - , Chair of Nanoelectronics (Author)
  • Thomas Mikolajick - , Chair of Nanoelectronics, NaMLab - Nanoelectronic materials laboratory gGmbH (Author)
  • Walter M. Weber - , Vienna University of Technology (Author)

Abstract

Schottky-barrier (SB) transistors show great potential as advanced transistors for meeting power, performance, area, and cost requirements. In this study, the dominant transport mechanisms of SB Si-nanowire (NW) transistors were investigated with respect to channel length for accurate performance estimation and to provide key insights for practical applications. Evaluations of the temperature-dependent drain current, transconductance, and activation energy from SB Si-NW transistors revealed that the SB-dominant thermionic effect competes with Si-NW channel-limited conduction when the initial SB height is relatively low. Moreover, the Si-NW channel length was sufficiently long to dominate the total resistance, overcoming resistance effects arising from the SB.

Details

Original languageEnglish
Pages (from-to)168-172
Number of pages5
JournalIEEE journal of the Electron Devices Society
Volume13
Publication statusPublished - 4 Mar 2025
Peer-reviewedYes

External IDs

ORCID /0000-0003-3814-0378/work/181859849

Keywords

Keywords

  • Channel length dependence, channel-limited conduction, Schottky-barrier dominant thermionic effect, Schottky-barrier transistors, Si-nanowires