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Research Portal of the TU Dresden

IEEE Journal of the Electron Devices Society

ISSNs: 2168-6734

Institute of Electrical and Electronics Engineers Inc.

Scopus rating (2023): CiteScore 5.2 SJR 0.505 SNIP 0.955

Indexed in DOAJ

Journal

Titles	IEEE Journal of the Electron Devices Society IEEE journal of the Electron Devices Society
ISSNs	2168-6734
Publisher	Institute of Electrical and Electronics Engineers Inc.
ZDB-ID	2696552-5

Keywords

ASJC Scopus subject areas

Library keywords

620 Engineering and allied operations

Related content

Research output

Generating Predictive Models for Emerging Semiconductor Devices

Reuter, M., Kramer, A., Lee, D., Trommer, J., Bhattacharjee, N., Galderisi, G. & Mikolajick, T. & 1 others, Hofmann, K., 2024, In: IEEE journal of the Electron Devices Society. 12, p. 56-64 9 p.

Research output: Contribution to journal › Research article › Contributed › peer-review

Machine Learning-Based Compact Model Design for Reconfigurable FETs

Reuter, M., Wilm, J., Kramer, A., Bhattacharjee, N., Beyer, C., Trommer, J. & Mikolajick, T. & 1 others, Hofmann, K., 2024, In: IEEE journal of the Electron Devices Society. 12, p. 310-317 8 p.

Research output: Contribution to journal › Research article › Contributed › peer-review

Device Physics, Modeling and Simulation of Organic Electrochemical Transistors

Koch, M., Tseng, H., Weissbach, A., Iniguez, B., Leo, K., Kloes, A. & Kleemann, H. & 1 others, Darbandy, G., 2023, In: IEEE journal of the Electron Devices Society. 11, p. 665-671 7 p.

Research output: Contribution to journal › Research article › Contributed › peer-review

Investigation of Recovery Phenomena in Hf0.5Zr0.5O2-based 1T1C FeRAM

Okuno, J., Yonai, T., Kunihiro, T., Shuto, Y., Alcala, R., Lederer, M. & Seidel, K. & 4 others, Mikolajick, T., Schroeder, U., Tsukamoto, M. & Umebayashi, T., 2023, In: IEEE journal of the Electron Devices Society. 11, p. 43-46 4 p.

Research output: Contribution to journal › Research article › Contributed › peer-review

I-V-T Characteristics and Temperature Sensor Performance of a Fully-2D WSe₂/MoS₂ Heterojunction Diode at Cryogenic Temperatures

Matthus, C. D., Chava, P., Watanabe, K., Taniguchi, T., Mikolajick, T., Helm, M. & Erbe, A., 2023, In: IEEE journal of the Electron Devices Society. 11, p. 359-366 8 p.

Research output: Contribution to journal › Research article › Contributed › peer-review

View all research output (14)