IEEE Journal of the Electron Devices Society
ISSNs: 2168-6734
IEEE, New York [u. a.]
Scopus rating (2023): CiteScore 5.2 SJR 0.505 SNIP 0.955
Indexed in DOAJ
Journal
| Titles |
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|---|---|
| ISSNs | 2168-6734 |
| Publisher | IEEE, New York [u. a.] |
| ZDB-ID | 2696552-5 |
Related content
- Research output
Generating Predictive Models for Emerging Semiconductor Devices
Reuter, M., Kramer, A., Lee, D., Trommer, J., Bhattacharjee, N., Galderisi, G., Mikolajick, T., & 1 othersHofmann, K., 2024, In: IEEE journal of the Electron Devices Society. 12, p. 56-64 9 p.Research output: Contribution to journal › Research article › Contributed › peer-review
Machine Learning-Based Compact Model Design for Reconfigurable FETs
Reuter, M., Wilm, J., Kramer, A., Bhattacharjee, N., Beyer, C., Trommer, J., Mikolajick, T., & 1 othersHofmann, K., 2024, In: IEEE journal of the Electron Devices Society. 12, p. 310-317 8 p.Research output: Contribution to journal › Research article › Contributed › peer-review
Device Physics, Modeling and Simulation of Organic Electrochemical Transistors
Koch, M., Tseng, H., Weissbach, A., Iniguez, B., Leo, K., Kloes, A., Kleemann, H., & 1 othersDarbandy, G., 2023, In: IEEE journal of the Electron Devices Society. 11, p. 665-671 7 p.Research output: Contribution to journal › Research article › Contributed › peer-review
I-V-T Characteristics and Temperature Sensor Performance of a Fully-2D WSe2/MoS2 Heterojunction Diode at Cryogenic Temperatures
Matthus, C. D., Chava, P., Watanabe, K., Taniguchi, T., Mikolajick, T., Helm, M. & Erbe, A., 2023, In: IEEE journal of the Electron Devices Society. 11, p. 359-366 8 p.Research output: Contribution to journal › Research article › Contributed › peer-review
BEOL Integrated Ferroelectric HfO2 based Capacitors for FeRAM: Extrapolation of Reliability Performance to Use Conditions
Alcala, R., Materano, M., Lomenzo, P. D., Grenouillet, L., Francois, T., Coignus, J., Vaxelaire, N., & 5 othersCarabasse, C., Chevalliez, S., Andrieu, F., Mikolajick, T. & Schroeder, U., 2022, In: IEEE journal of the Electron Devices Society. 10, p. 907-912 6 p.Research output: Contribution to journal › Research article › Contributed › peer-review