Channel Length Dependence of Effective Barrier Height Experienced by Charge Carriers in Schottky-Barrier Transistors Based on Si-Nanowire Arrays

Publikation: Beitrag in FachzeitschriftForschungsartikelBeigetragenBegutachtung

Beitragende

  • Dae Young Jeon - , Gyeongsang National University (Autor:in)
  • So Jeong Park - , Korean Intellectual Property Office (Autor:in)
  • Sebastian Pregl - , NaMLab - Nanoelectronic materials laboratory gGmbH (Autor:in)
  • Jens Trommer - , NaMLab - Nanoelectronic materials laboratory gGmbH (Autor:in)
  • Andre Heinzig - , Professur für Nanoelektronik (Autor:in)
  • Thomas Mikolajick - , Professur für Nanoelektronik, NaMLab - Nanoelectronic materials laboratory gGmbH (Autor:in)
  • Walter M. Weber - , Technische Universitat Wien (Autor:in)

Abstract

Schottky-barrier (SB) transistors show great potential as advanced transistors for meeting power, performance, area, and cost requirements. In this study, the dominant transport mechanisms of SB Si-nanowire (NW) transistors were investigated with respect to channel length for accurate performance estimation and to provide key insights for practical applications. Evaluations of the temperature-dependent drain current, transconductance, and activation energy from SB Si-NW transistors revealed that the SB-dominant thermionic effect competes with Si-NW channel-limited conduction when the initial SB height is relatively low. Moreover, the Si-NW channel length was sufficiently long to dominate the total resistance, overcoming resistance effects arising from the SB.

Details

OriginalspracheEnglisch
Seiten (von - bis)168-172
Seitenumfang5
FachzeitschriftIEEE journal of the Electron Devices Society
Jahrgang13
PublikationsstatusVeröffentlicht - 4 März 2025
Peer-Review-StatusJa

Externe IDs

ORCID /0000-0003-3814-0378/work/181859849

Schlagworte

Schlagwörter

  • Channel length dependence, channel-limited conduction, Schottky-barrier dominant thermionic effect, Schottky-barrier transistors, Si-nanowires