Built-In Bias Generation in Anti-Ferroelectric Stacks: Methods and Device Applications

Research output: Contribution to journalResearch articleContributedpeer-review

Contributors

Details

Original languageEnglish
Pages (from-to)1019-1025
Number of pages7
JournalIEEE journal of the Electron Devices Society
Volume6
Publication statusPublished - 2018
Peer-reviewedYes

External IDs

Scopus 85045743254

Keywords