Accelerated SLID Bonding for Fine-Pitch Interconnects with Porous Microstructure

Research output: Contribution to conferencesPaperContributedpeer-review

Contributors

Details

Original languageGerman
Publication statusPublished - 2017
Peer-reviewedYes

Conference

Title67th IEEE Electronic Components and Technology Conference
Abbreviated titleECTC 2017
Conference number67
Duration30 May - 2 June 2017
Website
Degree of recognitionInternational event
LocationWalt Disney World Swan and Dolphin Resort
CityLake Buena Vista
CountryUnited States of America

External IDs

Scopus 85028048490
ORCID /0000-0001-8576-7611/work/165877180