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Research Portal of the TU Dresden

Electrical Overstress Electrostatic Discharge Symposium proceedings

ISSNs: 0739-5159

ESD Association, United States of America

Scopus rating (2024): CiteScore 0.7 SJR 0.206 SNIP 0.23

Journal

Titles	Electrical Overstress Electrostatic Discharge Symposium proceedings(1979 → …) Electrical Overstress/Electrostatic Discharge Symposium Proceedings
Additional searchable titles	Proceedings of the 1999 EOS/ESD Symposium 'Electrical Overstress/Electrostatic Discharge, 1992 EOS/ESD, Electrical Overstress/Electrostatic Discharge Symposium Proceedings
ISSNs	0739-5159
Publisher	ESD Association
Country/Territory	United States of America
Scopus ID	110509
ZDB-ID	627460-2

Keywords

ASJC Scopus subject areas

Electrical and Electronic Engineering

Library keywords

620 Engineering and allied operations

Related content

Research output

Influence of well profile and gate length on the ESD performance of a fully silicided 0.25 μm CMOS technology

Bock, K., Russ, C., Badenes, G., Groeseneken, G. & Deferm, L., 1998, In: Electrical Overstress Electrostatic Discharge Symposium proceedings. 21, 4, p. 286-294 9 p.

Research output: Contribution to journal › Research article › Contributed › peer-review

Compact model for the grounded-gate nMOS behaviour under CDM ESD stress

Russ, C., Verhaege, K., Bock, K., Roussel, P. J., Groeseneken, G. & Maes, H. E., 1996, In: Electrical Overstress Electrostatic Discharge Symposium proceedings. p. 302-315 14 p.

Research output: Contribution to journal › Conference article › Contributed › peer-review

Field emitter-based ESD-protection circuits for high-frequency devices and IC's

Bock, K. & Hartnagel, H. L., 1992, In: Electrical Overstress Electrostatic Discharge Symposium proceedings. p. 4.7.1-4.7.7

Research output: Contribution to journal › Conference article › Contributed › peer-review

View all research output (3)