Metallographic preparation of the SnAgCu solders for optical microscopy and EBSD Investigations
Publikation: Beitrag in Buch/Konferenzbericht/Sammelband/Gutachten › Beitrag in Konferenzband › Beigetragen
Beitragende
Abstract
In order to investigate the microstructure of lead-free SnAgCu solders by optical microscopy and Electron Backscatter Diffraction it is necessary to provide a qualitative metallographic preparation. The difficulties of a preparation of these solders are connected with a high softness and presence of hard intermetallic compounds. They are discussed in this study and the appropriate recipe is proposed. The samples were manufactured of SnAg3Cu0.7 (wt. %) solder in a form of solder spheres with a diameter of 270 μm, cooled at the rate of 1.1 K/s. The metallographic preparation was carried out on a TegraSystem from Struers. The quality of the prepared samples was checked by image Orientation Imaging Microscopy softwarequality maps, created by the Orientation Imaging Microscopy software.
Details
Originalsprache | Deutsch |
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Titel | 33rd International Spring Seminar on Electronics Technology, ISSE 2010 |
Herausgeber (Verlag) | IEEE |
Seiten | 18-23 |
Seitenumfang | 6 |
ISBN (Print) | 978-1-4244-7849-1 |
Publikationsstatus | Veröffentlicht - 16 Mai 2010 |
Peer-Review-Status | Nein |
Konferenz
Titel | 33rd International Spring Seminar on Electronics Technology, ISSE 2010 |
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Dauer | 12 - 16 Mai 2010 |
Ort | Warsaw, Poland |
Externe IDs
Scopus | 77956978165 |
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ORCID | /0000-0001-8576-7611/work/165877198 |
Schlagworte
Schlagwörter
- Suspensions, Optical imaging, Microscopy, Epoxy resins, Abrasives, Optical microscopy