Metallographic preparation of the SnAgCu solders for optical microscopy and EBSD Investigations

Publikation: Beitrag in Buch/Konferenzbericht/Sammelband/GutachtenBeitrag in KonferenzbandBeigetragen

Abstract

In order to investigate the microstructure of lead-free SnAgCu solders by optical microscopy and Electron Backscatter Diffraction it is necessary to provide a qualitative metallographic preparation. The difficulties of a preparation of these solders are connected with a high softness and presence of hard intermetallic compounds. They are discussed in this study and the appropriate recipe is proposed. The samples were manufactured of SnAg3Cu0.7 (wt. %) solder in a form of solder spheres with a diameter of 270 μm, cooled at the rate of 1.1 K/s. The metallographic preparation was carried out on a TegraSystem from Struers. The quality of the prepared samples was checked by image Orientation Imaging Microscopy softwarequality maps, created by the Orientation Imaging Microscopy software.

Details

OriginalspracheDeutsch
Titel33rd International Spring Seminar on Electronics Technology, ISSE 2010
Herausgeber (Verlag)IEEE
Seiten18-23
Seitenumfang6
ISBN (Print)978-1-4244-7849-1
PublikationsstatusVeröffentlicht - 16 Mai 2010
Peer-Review-StatusNein

Konferenz

Titel33rd International Spring Seminar on Electronics Technology, ISSE 2010
Dauer12 - 16 Mai 2010
OrtWarsaw, Poland

Externe IDs

Scopus 77956978165
ORCID /0000-0001-8576-7611/work/165877198

Schlagworte

Schlagwörter

  • Suspensions, Optical imaging, Microscopy, Epoxy resins, Abrasives, Optical microscopy