Tracking speed bumps in organic field-effect transistors via pump-probe Kelvin-probe force microscopy

Research output: Contribution to journal › Research article › Contributed › peer-review

Contributors

Details

Original languageEnglish
Pages (from-to)244502-
JournalJournal of Applied Physics
Issue number24
Publication statusPublished - 2015
Peer-reviewedYes

External IDs

Scopus 84952802287
ORCID /0000-0002-2484-4158/work/142257503

Keywords

Keywords

  • pump-probe Kelvin-probe force microscopy, Schottky barrier, organic field-effect transistors