Thin substrate handling by electrostatic force

Research output: Contribution to book/Conference proceedings/Anthology/ReportConference contributionContributedpeer-review

Contributors

  • Robert Wieland - , Fraunhofer Institute for Reliability and Microintegration (Author)
  • Karlheinz Bock - , Chair of Electronic Packaging Technology, Fraunhofer Institute for Reliability and Microintegration (Author)
  • Erwin Hacker - , Fraunhofer Institute for Reliability and Microintegration (Author)
  • Christof Landesberger - , Fraunhofer Institute for Reliability and Microintegration (Author)
  • Peter Ramm - , Fraunhofer Institute for Reliability and Microintegration (Author)

Abstract

Efficient handling and processing of thinned Si-substrates becomes increasingly important for such technologies like 3D system integration, MEMS applications and advanced packaging and micro integration. Using suitable adhesives to bond device wafers temporarily to a rigid handling wafer can offer an efficient solution for 3D IC fabrication - if the material is satisfying a set of stringent requirements. In the future this may be replaced or at least supplemented by a novel handling technique that uses mobile electrostatic carrier ("mobile e-Chuck"), fabricated by processing a standard Si-wafer. The corresponding principle is based on electrostatic forces between the e-Chuck wafer, serving as a mobile handling substrate, and the thin device wafer or chips. The mobile e-Chuck is fully CMOS-compatible and it allows long duration times for electrostatic holding also after disconnecting a charging unit.

Details

Original languageGerman
Title of host publication2nd European Conference & Exhibition on Integration Issues of Miniaturized Systems - MOMS, MOEMS, ICS and Electronic Components
PublisherVDE Verlag, Berlin [u. a.]
Pages1-4
Number of pages4
ISBN (print)978-3-8007-3081-0
Publication statusPublished - 10 Apr 2008
Peer-reviewedYes

Conference

Title2nd European Conference & Exhibition on Integration Issues of Miniaturized Systems - MOMS, MOEMS, ICS and Electronic Components
Duration9 - 10 April 2008
LocationBarcelona, Spain

External IDs

ORCID /0000-0002-0757-3325/work/139064839

Keywords

Keywords

  • Electrostatics, Mobile communication, Silicon, Electrodes, Substrates, Voltage measurement, Dielectrics