Thin substrate handling by electrostatic force

Publikation: Beitrag in Buch/Konferenzbericht/Sammelband/GutachtenBeitrag in KonferenzbandBeigetragenBegutachtung

Beitragende

  • Robert Wieland - , Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration (Autor:in)
  • Karlheinz Bock - , Professur für Aufbau- und Verbindungstechnik der Elektronik, Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration (Autor:in)
  • Erwin Hacker - , Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration (Autor:in)
  • Christof Landesberger - , Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration (Autor:in)
  • Peter Ramm - , Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration (Autor:in)

Abstract

Efficient handling and processing of thinned Si-substrates becomes increasingly important for such technologies like 3D system integration, MEMS applications and advanced packaging and micro integration. Using suitable adhesives to bond device wafers temporarily to a rigid handling wafer can offer an efficient solution for 3D IC fabrication - if the material is satisfying a set of stringent requirements. In the future this may be replaced or at least supplemented by a novel handling technique that uses mobile electrostatic carrier ("mobile e-Chuck"), fabricated by processing a standard Si-wafer. The corresponding principle is based on electrostatic forces between the e-Chuck wafer, serving as a mobile handling substrate, and the thin device wafer or chips. The mobile e-Chuck is fully CMOS-compatible and it allows long duration times for electrostatic holding also after disconnecting a charging unit.

Details

OriginalspracheDeutsch
Titel2nd European Conference & Exhibition on Integration Issues of Miniaturized Systems - MOMS, MOEMS, ICS and Electronic Components
Herausgeber (Verlag)VDE Verlag, Berlin [u. a.]
Seiten1-4
Seitenumfang4
ISBN (Print)978-3-8007-3081-0
PublikationsstatusVeröffentlicht - 10 Apr. 2008
Peer-Review-StatusJa

Konferenz

Titel2nd European Conference & Exhibition on Integration Issues of Miniaturized Systems - MOMS, MOEMS, ICS and Electronic Components
Dauer9 - 10 April 2008
OrtBarcelona, Spain

Externe IDs

ORCID /0000-0002-0757-3325/work/139064839

Schlagworte

Schlagwörter

  • Electrostatics, Mobile communication, Silicon, Electrodes, Substrates, Voltage measurement, Dielectrics