Thermal degradation of joined thick Au and Al elements
Research output: Contribution to journal › Research article › Contributed › peer-review
Contributors
Details
| Original language | English |
|---|---|
| Pages (from-to) | 31-34 |
| Number of pages | 4 |
| Journal | Microelectronics International |
| Volume | 21 |
| Issue number | 1 |
| Publication status | Published - 2004 |
| Peer-reviewed | Yes |
External IDs
| Scopus | 1242338187 |
|---|