Chair of Microstructure Physics

Organisational unit: Chair

Organisation profile

Former Chair holder: Prof. Dr. rer. nat. habil. Wolfgang Hauffe

Former unit

Active until. 31 Dec 2005.

Contact

Parent units

Institute of Solid State and Materials Physics

75 years of Kossel patterns: past and future

Langer, E. & Däbritz, S., 1 Feb 2010, In: IOP Conference Series: Materials Science and Engineering. 7, 14 p., 012015.

Research output: Contribution to journal › Review article › Invited › peer-review

First X-ray fluorescence excited Kossel diffraction in SEM

Langer, E., Haschke, M. & Däbritz, S., Jun 2008, In: Microchimica Acta. 161, 3-4, p. 455-458 4 p.

Research output: Contribution to journal › Research article › Contributed › peer-review

Ion Beam Preparation Procedures for Three-dimensional SEM Resolved Kikuchi (EBSD) and Kossel Microdiffraction Analysis of Deformed Metals

Hauffe, W., Simons, G., Kunze, K., Langer, E. & Mitro, R. J., 1 Aug 2005, In: Microscopy and microanalysis. 11, Suppl.2, p. 840-841 2 p.

Research output: Contribution to journal › Research article › Contributed › peer-review

Darstellung von Co_2-xZn_xMo₃O ₈-Einkristallen mit definierter Zusammensetzung durch Chemischen Transport

Steiner, U., Reichelt, W., Daminova, S. & Langer, E., 2005, In: Zeitschrift fur Anorganische und Allgemeine Chemie. 631, 2-3, p. 364-368 5 p.

Research output: Contribution to journal › Research article › Contributed › peer-review

3D Microscopy and Microanalysis of Au-Al Ultrasonic Bonds by Specific Ion Beam Processing Steps and Scanning Electron Microscopy

Hauffe, W., Bochenek, A., Lukaszewicz, M., Langer, E. & Mitro, R. J., 2004, In: Microscopy and microanalysis. 10, Suppl. 2, p. 1156-1157 2 p.

Research output: Contribution to journal › Research article › Contributed › peer-review

View all research output (10)

Microelectronics International

ISSNs: 1356-5362

Additional searchable ISSN (electronic): 1356-5362

Emerald Group Publishing, Bingley

Scopus rating (2023): CiteScore 1.9 SJR 0.188 SNIP 0.354

Journal

Journal of analytical atomic spectrometry : JAAS

ISSNs: 0267-9477

Additional searchable ISSN (electronic): 1364-5544

Royal Society of Chemistry, United Kingdom

Scopus rating (2023): CiteScore 6.2 SJR 0.722 SNIP 0.998

Journal

Microchimica acta : an international journal on micro and trace analysis

ISSNs: 0026-3672

Additional searchable ISSN (electronic): 1436-5073

Springer Verlag Wien, Austria

Scopus rating (2023): CiteScore 9.8 SJR 0.848 SNIP 0.778

Journal

IOP Conference Series: Materials Science and Engineering

ISSNs: 1757-8981

Additional searchable ISSN (electronic): 1757-899X

IOP Publishing Ltd.

Scopus rating (2021): CiteScore 1.1 SJR 0.249 SNIP 0.357

Journal: Book series

Microscopy and microanalysis

ISSNs: 1431-9276

Additional searchable ISSN (electronic): 1435-8115

Oxford University Press, United States of America

Scopus rating (2023): CiteScore 1.1 SJR 0.387 SNIP 0.475

Journal

View all journals (9)