Simulation of integrate-and-fire neuron circuits using HfO2-based ferroelectric field effect transistors

Research output: Contribution to book/Conference proceedings/Anthology/ReportConference contributionContributedpeer-review

Contributors

  • Bharathwaj Suresh - , Birla Institute of Technology and Science Pilani (Author)
  • Martin Bertele - , Bielefeld University (Author)
  • Evelyn T. Breyer - , TUD Dresden University of Technology (Author)
  • Philipp Klein - , Birla Institute of Technology and Science Pilani (Author)
  • Halid Mulaosmanovic - , TUD Dresden University of Technology (Author)
  • Thomas Mikolajick - , Chair of Nanoelectronics, TUD Dresden University of Technology (Author)
  • Stefan Slesazeck - , TUD Dresden University of Technology (Author)
  • Elisabetta Chicca - , Birla Institute of Technology and Science Pilani (Author)

Abstract

Inspired by neurobiological systems, Spiking Neural Networks (SNNs) are gaining an increasing interest in the field of bio-inspired machine learning. Neurons, as central processing and short-term memory units of biological neural systems, are thus at the forefront of cutting-edge research approaches. The realization of CMOS circuits replicating neuronal features, namely the integration of action potentials and firing according to the all-or-nothing law, imposes various challenges like large area and power consumption. The non-volatile storage of polarization states and accumulative switching behavior of nanoscale HfO2 - based Ferroelectric Field-Effect Transistors (FeFETs), promise to circumvent these issues. In this paper, we propose two FeFET-based neuronal circuits emulating the Integrate-and-Fire (IF) behavior of biological neurons on the basis of SPICE simulations. Additionally, modulating the depolarization of the FeFETs enables the replication of a biology-based concept known as membrane leakage. The presented capacitor-free implementation is crucial for the development of neuromorphic systems that allow more complex features at a given area and power constraint.

Details

Original languageEnglish
Title of host publication2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS)
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages229-232
Number of pages4
ISBN (electronic)978-1-7281-0996-1
ISBN (print)978-1-7281-0997-8
Publication statusPublished - Nov 2019
Peer-reviewedYes

Publication series

SeriesIEEE International Conference on Electronics, Circuits and Systems (ICECS)

Conference

Title26th IEEE International Conference on Electronics, Circuits and Systems
Abbreviated titleICECS 2019
Conference number26
Duration27 - 29 November 2019
Degree of recognitionInternational event
LocationPorto Antico Conference Centre
CityGenoa
CountryItaly

External IDs

ORCID /0000-0003-3814-0378/work/142256370

Keywords

Keywords

  • Ferroelectric FET (FeFET), Hafnium oxide, Integrate-and-fire (IF) neurons, Leaky integration, Neuromorphic circuits