Simulation of integrate-and-fire neuron circuits using HfO2-based ferroelectric field effect transistors

Publikation: Beitrag in Buch/Konferenzbericht/Sammelband/GutachtenBeitrag in KonferenzbandBeigetragenBegutachtung

Beitragende

  • Bharathwaj Suresh - , Birla Institute of Technology and Science Pilani (Autor:in)
  • Martin Bertele - , Universität Bielefeld (Autor:in)
  • Evelyn T. Breyer - , Technische Universität Dresden (Autor:in)
  • Philipp Klein - , Birla Institute of Technology and Science Pilani (Autor:in)
  • Halid Mulaosmanovic - , Technische Universität Dresden (Autor:in)
  • Thomas Mikolajick - , Professur für Nanoelektronik, Technische Universität Dresden (Autor:in)
  • Stefan Slesazeck - , Technische Universität Dresden (Autor:in)
  • Elisabetta Chicca - , Birla Institute of Technology and Science Pilani (Autor:in)

Abstract

Inspired by neurobiological systems, Spiking Neural Networks (SNNs) are gaining an increasing interest in the field of bio-inspired machine learning. Neurons, as central processing and short-term memory units of biological neural systems, are thus at the forefront of cutting-edge research approaches. The realization of CMOS circuits replicating neuronal features, namely the integration of action potentials and firing according to the all-or-nothing law, imposes various challenges like large area and power consumption. The non-volatile storage of polarization states and accumulative switching behavior of nanoscale HfO2 - based Ferroelectric Field-Effect Transistors (FeFETs), promise to circumvent these issues. In this paper, we propose two FeFET-based neuronal circuits emulating the Integrate-and-Fire (IF) behavior of biological neurons on the basis of SPICE simulations. Additionally, modulating the depolarization of the FeFETs enables the replication of a biology-based concept known as membrane leakage. The presented capacitor-free implementation is crucial for the development of neuromorphic systems that allow more complex features at a given area and power constraint.

Details

OriginalspracheEnglisch
Titel2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS)
Herausgeber (Verlag)Institute of Electrical and Electronics Engineers (IEEE)
Seiten229-232
Seitenumfang4
ISBN (elektronisch)978-1-7281-0996-1
ISBN (Print)978-1-7281-0997-8
PublikationsstatusVeröffentlicht - Nov. 2019
Peer-Review-StatusJa

Publikationsreihe

ReiheIEEE International Conference on Electronics, Circuits and Systems (ICECS)

Konferenz

Titel26th IEEE International Conference on Electronics, Circuits and Systems
KurztitelICECS 2019
Veranstaltungsnummer26
Dauer27 - 29 November 2019
BekanntheitsgradInternationale Veranstaltung
OrtPorto Antico Conference Centre
StadtGenoa
LandItalien

Externe IDs

ORCID /0000-0003-3814-0378/work/142256370

Schlagworte

Schlagwörter

  • Ferroelectric FET (FeFET), Hafnium oxide, Integrate-and-fire (IF) neurons, Leaky integration, Neuromorphic circuits