SDVSRM - a new SSRM based technique featuring dynamically adjusted, scanner synchronized sample voltages for measurement of actively operated devices

Research output: Contribution to journal › Research article › Contributed › peer-review

Contributors

Details

Original languageEnglish
Pages (from-to)24-32
JournalUltramicroscopy
Volume193
Publication statusPublished - 2018
Peer-reviewedYes

External IDs

Scopus 85048826816

Keywords

Library keywords