Scattering near-field microscopy in the THz region using a free-electron laser

Research output: Contribution to book/Conference proceedings/Anthology/Report › Conference contribution › Contributed › peer-review

Contributors

  • Hans Georg Von Ribbeck - , TUD Dresden University of Technology, Helmholtz-Zentrum Dresden-Rossendorf (HZDR) (Author)
  • Marc Tobias Wenzel - , TUD Dresden University of Technology (Author)
  • Rainer Jacob - , Helmholtz-Zentrum Dresden-Rossendorf (HZDR) (Author)
  • Lukas M. Eng - , Chair of Experimental Physics / Photophysics (Author)

Abstract

We present scattering-type scanning near- field optical micro-spectroscopy (s-SNOM) investigations successfully operated in the THz range with a wavelength independent spatial resolution of < 150 nm. As a variable and monochromatic radiation source we use the free-electron laser (FELBE) located at the Forschungszentrum Dresden-Rossendorf (FZD) tunable over the wavelength range from 4-250 μm.

Details

Original languageEnglish
Title of host publicationIRMMW-THz 2010 - 35th International Conference on Infrared, Millimeter, and Terahertz Waves, Conference Guide
Publication statusPublished - 2010
Peer-reviewedYes

Publication series

SeriesInternational Conference on Infrared and Millimeter Waves
ISSN2162-2027

Conference

Title35th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2010
Duration5 - 10 September 2010
CityRome
CountryItaly

External IDs

ORCID /0000-0002-2484-4158/work/175744052

Keywords

ASJC Scopus subject areas