RF small-signal modeling of HCI degradation in FDSOI NMOSFET using BSIM-IMG
Research output: Contribution to book/conference proceedings/anthology/report › Conference contribution › Contributed › peer-review
Contributors
Details
| Original language | English |
|---|---|
| Title of host publication | 2021 IEEE International Integrated Reliability Workshop (IIRW) |
| Pages | 33-37 |
| Number of pages | 5 |
| ISBN (electronic) | 978-1-6654-1794-5 |
| Publication status | Published - 2021 |
| Peer-reviewed | Yes |
Publication series
| Series | IEEE International Integrated Reliability Workshop (IIRW) |
|---|---|
| ISSN | 1930-8841 |
External IDs
| Scopus | 85123718300 |
|---|---|
| ORCID | /0000-0003-3814-0378/work/142256359 |
Keywords
Keywords
- HCI, FDSOI, RF reliability, S-parameters, BSIM-IMG