Reliability study on SMD components on an organic substrate with a thick copper core for power electronics applications
Research output: Contribution to book/conference proceedings/anthology/report › Conference contribution › Contributed › peer-review
Contributors
Abstract
In this work we present the results on a reliability study on SMD components mounted on an organic power electronics substrate. The substrate technology has been developed to meet the needs of high ampacity and thermal conductivity with an organic substrate material. Therefore a thick structured copper core was introduced throughout the entire substrate size (see fig. 1). On top of the copper core common FR4 multilayer structures are realised to create a typical SMD PCB surface. The bottom of the copper core was covered with one prepreg with a high thermal conductivity and one copper layer to be able to connect to a heat sink. The copper core becomes structured to enable the use as the layer for conducting high currents. Therefore insulation trenches were manufactured and plugged with a polymer.
Details
Original language | German |
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Title of host publication | 2015 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems |
Publisher | IEEE |
Pages | 1-4 |
Number of pages | 4 |
ISBN (print) | 978-1-4799-9949-1 |
Publication status | Published - 22 Apr 2015 |
Peer-reviewed | Yes |
Conference
Title | 2015 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems |
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Duration | 19 - 22 April 2015 |
Location | Budapest, Hungary |
External IDs
Scopus | 84944790556 |
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ORCID | /0000-0002-0757-3325/work/139064857 |
Keywords
Keywords
- Reliability, Substrates