Reliability of SrRuO3/SrTiO3/SrRuO3 Stacks for DRAM Applications

Research output: Contribution to journal › Research article › Contributed › peer-review

Contributors

  • U. Bottger - (Author)
  • S. Knebel - , NaMLab - Nanoelectronic materials laboratory gGmbH (Author)
  • S. Kupke - (Author)
  • T. Mikolajick - , Chair of Nanoelectronics (Author)
  • S. Schmelzer - (Author)
  • U. Schroeder - (Author)

Details

Original languageEnglish
Pages (from-to)1699 - 1701
JournalIEEE electron device letters
Volume33
Issue number12
Publication statusPublished - 2012
Peer-reviewedYes

External IDs

Scopus 84870395301

Keywords

Library keywords