Reconfigurable NAND/NOR logic gates in 28 nm HKMG and 22 nm FD-SOI FeFET technology

Research output: Contribution to book/Conference proceedings/Anthology/Report › Conference contribution › Contributed › peer-review

Contributors

Details

Original languageEnglish
Title of host publicationTechnical Digest - International Electron Devices Meeting, IEDM
Publication statusPublished - 2018
Peer-reviewedYes

External IDs

Scopus 85045212617

Keywords