Pulsed behavior of polymer protection devices
Research output: Contribution to book/conference proceedings/anthology/report › Conference contribution › Contributed › peer-review
Contributors
Abstract
Polymer protection devices are placed on circuit boards as chip devices to protect existing electronic devices from electrostatic discharge events (ESD). As there are no generally accepted standards for characterization of such devices, we used Transmission Line Pulsing (TLP) to determine trigger- and clamping-voltages as well as leakage currents. Using short duration pulses (less than 10 ns) from a Very-Fast Transmission Line Pulser (VF-TLP) gives information of the transient behavior during pulsing. The influence of the pulse width and amplitude on the current-voltage behavior was investigated on chip size polymer voltage suppressors.
Details
Original language | German |
---|---|
Title of host publication | 2009 32nd International Spring Seminar on Electronics Technology |
Publisher | IEEE |
Pages | 1-6 |
Number of pages | 6 |
ISBN (print) | 978-1-4244-4260-7 |
Publication status | Published - 17 May 2009 |
Peer-reviewed | Yes |
Conference
Title | 2009 32nd International Spring Seminar on Electronics Technology |
---|---|
Subtitle | Technology Integration, the path to New Solutions in Modern Electronics |
Abbreviated title | ISSE 2009 |
Conference number | 32 |
Duration | 13 - 17 May 2009 |
Location | Hotel Continental Brno |
City | Brno |
Country | Czech Republic |
External IDs
Scopus | 70449568843 |
---|---|
ORCID | /0000-0002-0757-3325/work/139064830 |
Keywords
Keywords
- Polymers, Protection, Electrostatic discharge, Printed circuits, Distributed parameter circuits, Leakage current, Transmission lines, Power system transients, Space vector pulse width modulation, Voltage