Pulsed behavior of polymer protection devices

Publikation: Beitrag in Buch/Konferenzbericht/Sammelband/GutachtenBeitrag in KonferenzbandBeigetragenBegutachtung

Beitragende

  • Detlef Bonfert - , Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration (Autor:in)
  • Horst Gieser - , Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration (Autor:in)
  • Karlheinz Bock - , Professur für Aufbau- und Verbindungstechnik der Elektronik, Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration (Autor:in)
  • Paul Svasta - , University Politehnica of Bucharest (Autor:in)
  • Ciprian Ionescu - , University Politehnica of Bucharest (Autor:in)

Abstract

Polymer protection devices are placed on circuit boards as chip devices to protect existing electronic devices from electrostatic discharge events (ESD). As there are no generally accepted standards for characterization of such devices, we used Transmission Line Pulsing (TLP) to determine trigger- and clamping-voltages as well as leakage currents. Using short duration pulses (less than 10 ns) from a Very-Fast Transmission Line Pulser (VF-TLP) gives information of the transient behavior during pulsing. The influence of the pulse width and amplitude on the current-voltage behavior was investigated on chip size polymer voltage suppressors.

Details

OriginalspracheDeutsch
Titel2009 32nd International Spring Seminar on Electronics Technology
Herausgeber (Verlag)IEEE
Seiten1-6
Seitenumfang6
ISBN (Print)978-1-4244-4260-7
PublikationsstatusVeröffentlicht - 17 Mai 2009
Peer-Review-StatusJa

Konferenz

Titel2009 32nd International Spring Seminar on Electronics Technology
UntertitelTechnology Integration, the path to New Solutions in Modern Electronics
KurztitelISSE 2009
Veranstaltungsnummer32
Dauer13 - 17 Mai 2009
OrtHotel Continental Brno
StadtBrno
LandTschechische Republik

Externe IDs

Scopus 70449568843
ORCID /0000-0002-0757-3325/work/139064830

Schlagworte

Schlagwörter

  • Polymers, Protection, Electrostatic discharge, Printed circuits, Distributed parameter circuits, Leakage current, Transmission lines, Power system transients, Space vector pulse width modulation, Voltage