Probing Magnetic Properties at the Nanoscale: A Novel Setup for In-situ Hall Measurements in a TEM
Research output: Contribution to journal › Meeting abstract › Contributed › peer-review
Contributors
Details
| Original language | English |
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| Pages (from-to) | 1011 |
| Number of pages | 1 |
| Journal | Microscopy and microanalysis |
| Volume | 30 |
| Issue number | Suppl 1 |
| Publication status | Published - 24 Jul 2024 |
| Peer-reviewed | Yes |
Conference
| Title | 82nd Annual Meeting Microscopy Society of America & the 58th Annual Meeting Microanalysis Society |
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| Abbreviated title | M&M 2024 |
| Description | Microscopy & Microanalysis 2024 |
| Duration | 28 July - 1 August 2024 |
| Website | |
| Location | Huntington Convention Center |
| City | Cleveland |
| Country | United States of America |
External IDs
| ORCID | /0000-0002-4859-4325/work/226150312 |
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