Probing Magnetic Properties at the Nanoscale: A Novel Setup for In-situ Hall Measurements in a TEM

Research output: Contribution to journal › Meeting abstract › Contributed › peer-review

Contributors

Details

Original languageEnglish
Pages (from-to)1011
Number of pages1
JournalMicroscopy and microanalysis
Volume30
Issue numberSuppl 1
Publication statusPublished - 24 Jul 2024
Peer-reviewedYes

Conference

Title82nd Annual Meeting Microscopy Society of America & the 58th Annual Meeting Microanalysis Society
Abbreviated titleM&M 2024
DescriptionMicroscopy & Microanalysis 2024
Duration28 July - 1 August 2024
Website
LocationHuntington Convention Center
CityCleveland
CountryUnited States of America

External IDs

ORCID /0000-0002-4859-4325/work/226150312

Keywords

ASJC Scopus subject areas