Polarization mode preservation in elliptical index tailored optical fibers for apertureless scanning near-field optical microscopy

Research output: Contribution to journalResearch articleContributedpeer-review

Contributors

  • Christoph Zeh - , Fraunhofer Institute for Nondestructive Testing, TUD Dresden University of Technology (Author)
  • Ron Spittel - , Leibniz Institute of Photonic Technology (Author)
  • Sonja Unger - , Leibniz Institute of Photonic Technology (Author)
  • Jörg Opitz - , Fraunhofer Institute for Nondestructive Testing (Author)
  • Bernd Köhler - , Fraunhofer Institute for Nondestructive Testing (Author)
  • Johannes Kirchhof - , Leibniz Institute of Photonic Technology (Author)
  • Hartmut Bartelt - , Leibniz Institute of Photonic Technology (Author)
  • Lukas M. Eng - , Chair of Experimental Physics / Photophysics (Author)

Abstract

We report on the development of elliptical, index tailored optical fibers for higher-order mode preservation for fiber-based, apertureless, internally illuminated scanning near-field optical microscopy (ai-SNOM). The fiber structure is simulated by the finite element method, showing large spreads of the effective indices for neighboring first higher-order modes. We demonstrate experimentally that due to this spread, the first higher-order modes do not couple, hence, the polarization is maintained, when the fiber is bent down to 1 cm radius. Further, we discuss the implications for ai-SNOM applications.

Details

Original languageEnglish
Article number103108
JournalApplied physics letters
Volume97
Issue number10
Publication statusPublished - 6 Sept 2010
Peer-reviewedYes

External IDs

ORCID /0000-0002-2484-4158/work/158768103

Keywords

ASJC Scopus subject areas