Origin of Temperature-Dependent Ferroelectricity in Si-Doped HfO2

Research output: Contribution to journalResearch articleContributedpeer-review

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Details

Original languageEnglish
Article number1700489
JournalAdvanced electronic materials
Volume4
Issue number4
Publication statusPublished - 2018
Peer-reviewedYes

External IDs

WOS 000430115000005
Scopus 85044327505

Keywords