On the Control of the Fixed Charge Densities in Al<inf>2</inf>O<inf>3</inf>-Based Silicon Surface Passivation Schemes

Research output: Contribution to journalResearch articleContributedpeer-review

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Details

Original languageEnglish
Pages (from-to)28215–28222
Number of pages8
JournalACS Applied Materials and Interfaces
Volume7
Issue number51
Publication statusPublished - 2015
Peer-reviewedYes

External IDs

Scopus 84952880572

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