Off-state impact on FDSOI ring oscillator degradation under high voltage stress
Research output: Contribution to book/conference proceedings/anthology/report › Conference contribution › Contributed › peer-review
Contributors
Abstract
The degradation predicted by classical DC reliability methods, such as bias temperature instability (BTI) and hot carrier injection (HCI), might not translate sufficiently to the AC conditions, which are relevant on the circuit level. The direct analysis of circuit level reliability is therefore an essential task for hardware qualification in the near future. Ring oscillators (RO) offer a good model system, where both BTI and HCI contribute to the degradation. In this work, it is qualitatively shown that the additional off-state stress plays a crucial role at very high stress voltages, beyond upper usage boundaries. To yield an accurate RO lifetime prediction a frequency measurement setup with high resolution is used, which can resolve small changes in frequency during stress near operation conditions. An ACDC conversion model is developed predicting the resulting frequency change based on DC input data. From the extrapolation to 10 years of circuit lifetime the model predicts a very low frequency degradation below 0.2% under nominal operation conditions, where the off-state has a minor influence.
Details
Original language | English |
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Title of host publication | 2018 IEEE International Integrated Reliability Workshop (IIRW) |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Number of pages | 5 |
Volume | 2018 |
ISBN (electronic) | 9781538660393, 978-1-5386-6037-9 |
ISBN (print) | 978-1-5386-6040-9 |
Publication status | Published - Oct 2018 |
Peer-reviewed | Yes |
Publication series
Series | IEEE International Integrated Reliability Workshop (IIRW) |
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ISSN | 1930-8841 |
Conference
Title | 2018 IEEE International Integrated Reliability Workshop |
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Abbreviated title | IIRW 2018 |
Duration | 7 - 11 October 2018 |
Location | Stanford Sierra Conference Center |
City | South Lake Tahoe |
Country | United States of America |
External IDs
ORCID | /0000-0003-3814-0378/work/142256270 |
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Keywords
ASJC Scopus subject areas
Keywords
- Bias temperature instability, Circuit reliability, FD-SOI, Hot carrier injection, Off-state, Ring oscillator