Local Probing of Electrochemical Interfaces in Corrosion Research

Research output: Contribution to book/Conference proceedings/Anthology/ReportChapter in book/Anthology/ReportContributedpeer-review

Contributors

  • A. Schreyer - , ETH Zurich (Author)
  • T. Suter - , ETH Zurich (Author)
  • L. Eng - , University of Basel (Author)
  • H. Böhni - , ETH Zurich (Author)

Abstract

The corrosion resistance of stainless steel is mainly caused by heterogeneities. Inclusions especially play a key role as potential initiation sites. Since most of the electrochemical techniques provide only average data integrating over a relatively large surface area (square millimeters to square centimeters) they are inadequate for studying localized corrosion processes. Use of in-situ scanning probe microscopy (SPM, e.g., scanning tunneling micrsocopy (STM), atomic force microscopy (AFM)) and tip-sample distance modulation spectroscopy in conjunction with microelectrochemical techniques with a current detection limit of ≤10 fA enables investigations in the nano-and micrometer range.

Details

Original languageEnglish
Title of host publicationElectrochemical Nanotechnology
PublisherWiley-Blackwell, Hoboken, NJ
Pages199-213
Number of pages15
ISBN (electronic)9783527612154
ISBN (print)3527295208, 9783527295203
Publication statusPublished - 22 Dec 2007
Peer-reviewedYes
Externally publishedYes

External IDs

ORCID /0000-0002-2484-4158/work/175744087

Keywords

ASJC Scopus subject areas

Keywords

  • Bi-potentiostat, Chromium carbide, Current-potential, Metallurgical, Passivation