Local Probing of Electrochemical Interfaces in Corrosion Research

Publikation: Beitrag in Buch/Konferenzbericht/Sammelband/GutachtenBeitrag in Buch/Sammelband/GutachtenBeigetragenBegutachtung

Beitragende

  • A. Schreyer - , ETH Zürich (Autor:in)
  • T. Suter - , ETH Zürich (Autor:in)
  • L. Eng - , Universität Basel (Autor:in)
  • H. Böhni - , ETH Zürich (Autor:in)

Abstract

The corrosion resistance of stainless steel is mainly caused by heterogeneities. Inclusions especially play a key role as potential initiation sites. Since most of the electrochemical techniques provide only average data integrating over a relatively large surface area (square millimeters to square centimeters) they are inadequate for studying localized corrosion processes. Use of in-situ scanning probe microscopy (SPM, e.g., scanning tunneling micrsocopy (STM), atomic force microscopy (AFM)) and tip-sample distance modulation spectroscopy in conjunction with microelectrochemical techniques with a current detection limit of ≤10 fA enables investigations in the nano-and micrometer range.

Details

OriginalspracheEnglisch
TitelElectrochemical Nanotechnology
Herausgeber (Verlag)Wiley-Blackwell, Hoboken, NJ
Seiten199-213
Seitenumfang15
ISBN (elektronisch)9783527612154
ISBN (Print)3527295208, 9783527295203
PublikationsstatusVeröffentlicht - 22 Dez. 2007
Peer-Review-StatusJa
Extern publiziertJa

Externe IDs

ORCID /0000-0002-2484-4158/work/175744087

Schlagworte

ASJC Scopus Sachgebiete

Schlagwörter

  • Bi-potentiostat, Chromium carbide, Current-potential, Metallurgical, Passivation